JPH0581168B2 - - Google Patents
Info
- Publication number
- JPH0581168B2 JPH0581168B2 JP63252221A JP25222188A JPH0581168B2 JP H0581168 B2 JPH0581168 B2 JP H0581168B2 JP 63252221 A JP63252221 A JP 63252221A JP 25222188 A JP25222188 A JP 25222188A JP H0581168 B2 JPH0581168 B2 JP H0581168B2
- Authority
- JP
- Japan
- Prior art keywords
- plasma
- energy
- electrons
- signal
- etching
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000463 material Substances 0.000 claims description 62
- 238000012545 processing Methods 0.000 claims description 16
- 238000001514 detection method Methods 0.000 claims description 14
- 238000002347 injection Methods 0.000 claims 2
- 239000007924 injection Substances 0.000 claims 2
- 238000003672 processing method Methods 0.000 claims 1
- 238000000034 method Methods 0.000 description 36
- 238000005530 etching Methods 0.000 description 34
- 230000005284 excitation Effects 0.000 description 27
- 239000003990 capacitor Substances 0.000 description 17
- 230000004044 response Effects 0.000 description 11
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 10
- 230000008569 process Effects 0.000 description 10
- 229910052710 silicon Inorganic materials 0.000 description 10
- 239000010703 silicon Substances 0.000 description 10
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 9
- 230000000903 blocking effect Effects 0.000 description 8
- 238000001914 filtration Methods 0.000 description 8
- 229910052751 metal Inorganic materials 0.000 description 8
- 239000002184 metal Substances 0.000 description 8
- 239000004065 semiconductor Substances 0.000 description 8
- 239000012212 insulator Substances 0.000 description 7
- 235000012431 wafers Nutrition 0.000 description 7
- 238000000151 deposition Methods 0.000 description 6
- 239000000203 mixture Substances 0.000 description 6
- 239000007789 gas Substances 0.000 description 5
- 235000012239 silicon dioxide Nutrition 0.000 description 5
- 230000003321 amplification Effects 0.000 description 4
- 230000008021 deposition Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 238000003199 nucleic acid amplification method Methods 0.000 description 4
- 238000001020 plasma etching Methods 0.000 description 4
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 4
- 229920005591 polysilicon Polymers 0.000 description 4
- 239000000377 silicon dioxide Substances 0.000 description 4
- 230000001133 acceleration Effects 0.000 description 3
- 238000005137 deposition process Methods 0.000 description 3
- 238000001312 dry etching Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000012544 monitoring process Methods 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 238000004556 laser interferometry Methods 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 238000012552 review Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 229910016570 AlCu Inorganic materials 0.000 description 1
- 238000012935 Averaging Methods 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000010420 art technique Methods 0.000 description 1
- 230000003416 augmentation Effects 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000012631 diagnostic technique Methods 0.000 description 1
- 230000009881 electrostatic interaction Effects 0.000 description 1
- 238000004993 emission spectroscopy Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 150000002500 ions Chemical group 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000001499 laser induced fluorescence spectroscopy Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000012805 post-processing Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 238000005211 surface analysis Methods 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32917—Plasma diagnostics
- H01J37/32935—Monitoring and controlling tubes by information coming from the object and/or discharge
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Drying Of Semiconductors (AREA)
- Plasma Technology (AREA)
- ing And Chemical Polishing (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US130573 | 1987-12-09 | ||
| US07/130,573 US4846920A (en) | 1987-12-09 | 1987-12-09 | Plasma amplified photoelectron process endpoint detection apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01171225A JPH01171225A (ja) | 1989-07-06 |
| JPH0581168B2 true JPH0581168B2 (en]) | 1993-11-11 |
Family
ID=22445312
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63252221A Granted JPH01171225A (ja) | 1987-12-09 | 1988-10-07 | プラズマ処理装置及び方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US4846920A (en]) |
| EP (1) | EP0320425B1 (en]) |
| JP (1) | JPH01171225A (en]) |
| BR (1) | BR8806481A (en]) |
| CA (1) | CA1289270C (en]) |
| DE (1) | DE3879418T2 (en]) |
Families Citing this family (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2656465B1 (fr) * | 1989-12-21 | 1992-05-07 | France Etat | Procede de mesure des dimensions d'un espaceur. |
| US5160402A (en) * | 1990-05-24 | 1992-11-03 | Applied Materials, Inc. | Multi-channel plasma discharge endpoint detection method |
| JP3016821B2 (ja) * | 1990-06-15 | 2000-03-06 | 東京エレクトロン株式会社 | プラズマ処理方法 |
| US5198072A (en) * | 1990-07-06 | 1993-03-30 | Vlsi Technology, Inc. | Method and apparatus for detecting imminent end-point when etching dielectric layers in a plasma etch system |
| US5302882A (en) * | 1991-09-09 | 1994-04-12 | Sematech, Inc. | Low pass filter for plasma discharge |
| US5245794A (en) * | 1992-04-09 | 1993-09-21 | Advanced Micro Devices, Inc. | Audio end point detector for chemical-mechanical polishing and method therefor |
| US5325019A (en) * | 1992-08-21 | 1994-06-28 | Sematech, Inc. | Control of plasma process by use of harmonic frequency components of voltage and current |
| US5288367A (en) * | 1993-02-01 | 1994-02-22 | International Business Machines Corporation | End-point detection |
| US5330610A (en) * | 1993-05-28 | 1994-07-19 | Martin Marietta Energy Systems, Inc. | Method of digital epilaxy by externally controlled closed-loop feedback |
| US5824158A (en) * | 1993-06-30 | 1998-10-20 | Kabushiki Kaisha Kobe Seiko Sho | Chemical vapor deposition using inductively coupled plasma and system therefor |
| JP3223661B2 (ja) * | 1993-08-31 | 2001-10-29 | ソニー株式会社 | プラズマ堆積方法 |
| US5576629A (en) * | 1994-10-24 | 1996-11-19 | Fourth State Technology, Inc. | Plasma monitoring and control method and system |
| US5718511A (en) * | 1995-06-30 | 1998-02-17 | Lam Research Corporation | Temperature mapping method |
| US5654796A (en) * | 1995-12-22 | 1997-08-05 | Lam Research Corporation | Apparatus and method for mapping plasma characteristics |
| US5846373A (en) * | 1996-06-28 | 1998-12-08 | Lam Research Corporation | Method for monitoring process endpoints in a plasma chamber and a process monitoring arrangement in a plasma chamber |
| US6104487A (en) * | 1996-12-20 | 2000-08-15 | Texas Instruments Incorporated | Plasma etching with fast endpoint detector |
| US6034768A (en) * | 1997-09-26 | 2000-03-07 | Physical Sciences Inc. | Induced breakdown spectroscopy detector system with controllable delay time |
| US5969805A (en) | 1997-11-04 | 1999-10-19 | Micron Technology, Inc. | Method and apparatus employing external light source for endpoint detection |
| US7102737B2 (en) * | 1997-11-04 | 2006-09-05 | Micron Technology, Inc. | Method and apparatus for automated, in situ material detection using filtered fluoresced, reflected, or absorbed light |
| US6704107B1 (en) | 1997-11-04 | 2004-03-09 | Micron Technology, Inc. | Method and apparatus for automated, in situ material detection using filtered fluoresced, reflected, or absorbed light |
| US5993613A (en) * | 1997-11-07 | 1999-11-30 | Sierra Applied Sciences, Inc. | Method and apparatus for periodic polarity reversal during an active state |
| US6071375A (en) * | 1997-12-31 | 2000-06-06 | Lam Research Corporation | Gas purge protection of sensors and windows in a gas phase processing reactor |
| US6174407B1 (en) | 1998-12-03 | 2001-01-16 | Lsi Logic Corporation | Apparatus and method for detecting an endpoint of an etching process by transmitting infrared light signals through a semiconductor wafer |
| US6136719A (en) * | 1999-04-30 | 2000-10-24 | Lsi Logic Corporation | Method and arrangement for fabricating a semiconductor device |
| US6143667A (en) * | 1999-06-28 | 2000-11-07 | Micron Technology, Inc. | Method and apparatus for using photoemission to determine the endpoint of an etch process |
| US6970700B1 (en) * | 2000-01-31 | 2005-11-29 | Eni Technology, Inc. | Power delivery system |
| US6627464B2 (en) | 2001-02-07 | 2003-09-30 | Eni Technology, Inc. | Adaptive plasma characterization system |
| US6587019B2 (en) * | 2001-04-11 | 2003-07-01 | Eni Technology, Inc. | Dual directional harmonics dissipation system |
| CN1666316A (zh) * | 2002-07-03 | 2005-09-07 | 东京电子株式会社 | 对半导体处理参数进行非侵入式测量和分析的方法和装置 |
| CN1666314A (zh) * | 2002-07-03 | 2005-09-07 | 东京电子株式会社 | 半导体等离子体参数非侵入性测量和分析的方法和设备 |
| US7020224B2 (en) * | 2003-09-30 | 2006-03-28 | Pulse—LINK, Inc. | Ultra-wideband correlating receiver |
| US6980613B2 (en) * | 2003-09-30 | 2005-12-27 | Pulse-Link, Inc. | Ultra-wideband correlating receiver |
| CN101970166B (zh) * | 2007-12-13 | 2013-05-08 | 朗姆研究公司 | 等离子体无约束传感器及其方法 |
| US9997325B2 (en) | 2008-07-17 | 2018-06-12 | Verity Instruments, Inc. | Electron beam exciter for use in chemical analysis in processing systems |
| CN102203898B (zh) * | 2008-07-17 | 2016-11-16 | 真实仪器公司 | 在处理系统化学分析中使用的电子束激励器 |
| WO2010008598A1 (en) * | 2008-07-17 | 2010-01-21 | Verity Instruments, Inc. | Electron beam exciter for use in chemical analysis in processing systems |
| US9140653B2 (en) | 2010-10-08 | 2015-09-22 | Tsi Incorporated | Spark emission particle detector |
| US9909923B2 (en) * | 2014-09-05 | 2018-03-06 | Bwt Property, Inc. | Laser induced breakdown spectroscopy (LIBS) apparatus based on high repetition rate pulsed laser |
| FR3058602B1 (fr) * | 2016-11-08 | 2021-02-12 | Centre Nat Rech Scient | Circuit d'adaptation d'impedance entre un generateur et une charge a des frequences multiples, ensemble comportant un tel circuit et utlisation liee. |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA686529A (en) * | 1964-05-12 | Beauzee Claude | Method of manufacturing photo-electric semi-conductor devices | |
| JPS6050923A (ja) * | 1983-08-31 | 1985-03-22 | Hitachi Ltd | プラズマ表面処理方法 |
| JPS60243958A (ja) * | 1984-05-18 | 1985-12-03 | Hitachi Ltd | イオンビ−ム装置 |
| JPS6136A (ja) * | 1984-06-09 | 1986-01-06 | Maruzen Sekiyu Kagaku Kk | ２．６−ジ−ｔｅｒｔ−ブチルフエノ−ルの製造方法 |
| US4615761A (en) * | 1985-03-15 | 1986-10-07 | Hitachi, Ltd. | Method of and apparatus for detecting an end point of plasma treatment |
| US4602981A (en) * | 1985-05-06 | 1986-07-29 | International Business Machines Corporation | Monitoring technique for plasma etching |
| US4664769A (en) * | 1985-10-28 | 1987-05-12 | International Business Machines Corporation | Photoelectric enhanced plasma glow discharge system and method including radiation means |
| US4675072A (en) * | 1986-06-25 | 1987-06-23 | International Business Machines Corporation | Trench etch endpoint detection by LIF |
-
1987
- 1987-12-09 US US07/130,573 patent/US4846920A/en not_active Expired - Fee Related
-
1988
- 1988-10-05 CA CA000579536A patent/CA1289270C/en not_active Expired - Lifetime
- 1988-10-07 JP JP63252221A patent/JPH01171225A/ja active Granted
- 1988-10-25 DE DE8888480065T patent/DE3879418T2/de not_active Expired - Fee Related
- 1988-10-25 EP EP88480065A patent/EP0320425B1/en not_active Expired - Lifetime
- 1988-12-08 BR BR888806481A patent/BR8806481A/pt unknown
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01171225A (ja) | 1989-07-06 |
| EP0320425A2 (en) | 1989-06-14 |
| EP0320425A3 (en) | 1990-03-07 |
| DE3879418T2 (de) | 1993-09-23 |
| CA1289270C (en) | 1991-09-17 |
| BR8806481A (pt) | 1989-08-22 |
| US4846920A (en) | 1989-07-11 |
| DE3879418D1 (de) | 1993-04-22 |
| EP0320425B1 (en) | 1993-03-17 |
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